Proceedings of the IEEE Custom Integrated Circuits Conference (CICC), pp. 205~208, San Francisco, CA, September 2008.
This paper presents a practical method to estimate IC product performance and parametric yield solely from a well-chosen set of existing electrical measurements intended for technology monitoring at an early stage of manufacturing. We demonstrate that the components of mmWave PLL and product-like logic performance in a 65nm SOI CMOS technology are predicted within a 5% RMS error relative to mean.